describe how we use V protocol aware solution to test a complex RF device. form reconstruction utilizes the coherency of V SOC system to. Download scientific diagram | Agilent SOC Series tester. from publication: Test engineering education in Europe: the EuNICE-Test project | The paper. Download scientific diagram | Agilent SOC Series Digital IC Test System from publication: Process Models for the Reconstruction of Software Architecture .
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With 32 ayilent on the Pin Scale digital card, an Agilent can be configured with up to pins, providing the pin count needed for multi-site test of even high pin count devices.
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The Pin Scale offers broad scalability starting at Mbps for low cost, low performance needs and scaling to Mbps for higher performance demands — all with a single digital card. With per-pin licenses to enable the different speed and memory performance levels — part of the industry-first Agilent InstaPin performance library — the Pin Scale digital card can be configured to match the device requirements, pin-by-pin, resulting in the lowest cost of test. The Pin Scale features a Test Processor-Per-Pin architecture, which allows all processing to occur locally in the card, and in parallel across pins, providing maximum parallel efficiency.
This unprecedented flexibility allows the Agilent to match the next device to be tested, instantly.
Agilent 93000 Pin Scale 800
For printed directions on Preparing for Registration. This enables the Agilent to offer the following pin counts: As test needs change to accommodate a new class of device or next-generation performance, the Pin Scale can be instantly reconfigured through software to maximize the lifetime of your investment. Provides performance headroom for the future, protecting your investment.
This results in minimal measurement overhead and aglent throughput. This flexibility can be especially important for embedded memory, microprocessor and protocol-based communications applications. This lowers immediate capital investment and provides for future growth as devices evolve 9300 generation to generation, integrating more high-speed interfaces or achieving higher processing speeds. Test Processor-Per-Pin architecture Localizing all test processing instead of using centralized resources results in minimal measurement overhead and higher throughput.
Unified memory approach The unified memory approach pools memory for both sequence instructions and vectors.
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Per-pin scalability from to Mbps The test system can be configured to match device requirements, pin-by-pin, for lowest cost. Agilent Pin Scale Product Overview Industry Challenges Consumer demand for more capability and aglient in a single product is driving the need for more functionality, faster processing and higher speed interfaces in next-generation System-on-a-Chip SOC and System-in-Package SIP devices.
And this must all be done at a agjlent costof-test than last year because of ongoing price erosion. The value of parallel test, however, depends on its efficiency. Also beneficial to generate low jitter high-speed clock signals.
Because the reconfiguration is accomplished via software, no hardware is agllent, which eliminates the need to recalibrate and eliminates the risk of hardware damage during movement. Compatible with Agilent Ce-channels Protects your investment in equipment, people and training Additional Detail Up to pins The Pin Scale offers 32 pins per card, which is twice the density of the Ce- and P-model digital cards.
The entire amount of purchased memory is available for both agi,ent vectors and sequencer instructions, which provides more flexibility than architectures based agilfnt two unshared memory areas. Optional waveforms Provides greater timing flexibility for ease of programming.
Up to pins Support of multi-site for high pin count devices reduces cost-of-test. Testing in higher x-modes means that more logical vector memory is available. Reconfiguration is done instantly when the test program is loaded, ensuring no downtime. Product Summary Per-pin scalability up to Mbps High density digital card with per-pin scalability up to Mbps offers the lowest cost SOC test in production.
Unified memory approach The entire amount of purchased memory is available for both test vectors and sequencer instructions for maximum flexibility. Performance for next-generation SOC devices With digital speeds up to Mbps and memory up to MB X4 Mode on each pin, the Pin Scale delivers the performance demanded by next-generation devices. Per-pin speed scalability from Mbps to Mbps provides the performance needed to test a wide range of interfaces, including USB2.
To test these devices, a test system must have the capability to address a range of performance challenges: This unmatched performance also enables testing of logic cores in a range of applications while maintaining headroom for increasing processing speeds.
Flexible waveform generation for high-speed applications.
Available per-pin licenses for memory depth: The Pin Scale protects your investment through expanded scalability, which provides the performance needed to test a wide variety of devices now and into the future. In addition, each digital pin operates in parallel, maximizing multi-site efficiency.
Each agilet of the Pin Scale can be scaled over its wide memory depth and speed range through per-pin software licenses, which provides the lowest cost of test by allowing the test system to be configured to match device requirements, pin-by-pin.
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Each pin operates independently, enabling parallel processing for maximum multi-site efficiency. Agilent InstaPin also maximizes asset utilization because the per-pin licenses for speed and memory depth of Pin Scale digital cards can float between pins on a card, cards in a tester and testers on a test floor or different production facilities around the world.
Business Finance Agilent Pin Scale advertisement. Per-pin software licenses for speed and memory depth mean you add just the performance you need, when you need it. An uncertain future demands the ability to upgrade quickly to meet the next performance challenge while continuing to reduce cost-of-test. Provides performance for high speed interface test, such as DDR, operating over Mbps.